Long-term memory effects in GaN devices: from modeling to compensation? Pedro Mirassol Tomé Department of Electronics, Telecommunications and Informatics & IT, University of Aveiro João Lucas Gomes Department of Electronics, Telecommunications and Informatics & IT, University of Aveiro Cristiano Gonçalves Department of Electronics, Telecommunications and Informatics & IT, University of Aveiro Filipe Miguel Barradas Department of Electronics, Telecommunications and Informatics & IT, University of Aveiro Luís Cótimos Nunes Department of Electronics, Telecommunications and Informatics & IT, University of Aveiro Telmo Reis Cunha Department of Electronics, Telecommunications and Informatics & IT, University of Aveiro José Carlos Pedro Department of Electronics, Telecommunications and Informatics & IT, University of Aveiro Abstract No abstract available. PDF Published 2019-01-01 Issue Vol 10 (2019) Section Research highlights License